defect test中文是什么意思

defect vi. 叛变；逃走。 He defected to th ...
test n. 【动物；动物学】(软体类的)介壳，甲壳；【植物；植 ...
area defect test 面积缺陷试验
bit defect test 点缺陷试验
defect detecting test 缺陷检查试验; 缺陷检验; 探伤检查
genetic defect test 遗传缺陷试验
line defect test 线缺陷试验
defect n. 1.缺陷，缺点，弱点；短处。 2.不足，缺乏。 have some defect in eyesight 目力不佳。 have the defects of one's qualities 美中不足之处。 in defect of 若无…时；因无。 vi. 叛变；逃走。 He defected to the West. 他叛逃到西方。
in defect of 缺少; 若无...时
no defect 无缺陷的
acceptor defect 受体缺陷; 受主缺陷
accident defect 事故损坏
accidental defect 汽车耗损; 事故性缺陷
acquired defect 后天不足; 后天性缺损
allowable defect 容许缺陷; 允许缺陷
allowed defect 容许疵病
amorphous defect 非晶区缺陷
anion defect 阴离子亏损; 阴离子缺陷
antifrenkel defect 反弗伦凯尔缺陷
antischottky defect 反肖特基缺陷
antisite defect 反位缺陷
antistructure defect 反结构型缺陷
apparent defect 明显的缺陷
appearance defect 外表缺陷
area defect 面缺陷

千万人都在用的超大词汇词典翻译APP

Line defect test
线缺陷试验
With the development of microelectronic products ( integrated circuit , printed circuit board , etc ) directing to high density , thin separation and low defect ratio , its inspection requirement is higher on aspects of precision , efficiency , universal , and intelligence etc . therefore , this paper researched on the general key techniques in the field of microelectronic products vision inspection , covered the shortage of traditional inspection on aspects of fast and precision locating , image mosaic , and fine defect test , completed theory study on physical dimension and defect inspection of microelectronic products based on machine vision , developed the prototype and used lots of experiments to prove its correctness and feasibility
随着微电子产品(集成电路芯片、印刷电路板等)向着高密度、细间距和低缺陷方向发展,对其检测技术在精密、高效、通用和智能化等方面提出了更高要求。由此,本文对微电子产品视觉检测中的关键技术进行研究,弥补了传统检测在精确快速定位、图像全景组合和精细缺陷检测等方面的不足,最终完成基于机器视觉的微电子产品外形尺寸和缺陷检测的理论研究和样机研制,并进行了大量实验证明其正确性和可行性,力图为我国自主创新的微电子产品视觉检测技术提供理论和实际借鉴。